Electron microscopes use an electron beam to illuminate a specimen and produce a magnified image 500,000 times its normal size. Scanning electron microscopes (SEM) produce images of a sample by scanning it with a focused beam of electrons, producing signals that can be detected and that contain information about the sample's surface topography and composition. SEMs are used in all scientific disciplines for many different types of applications. In biology SEMs are used to look into individual plant and animals cells. Chemists use them to look at crystalline structures of chemical compounds; forensic scientists use them for trace evidence analysis. Scanning electron microscopes have different kinds of signal detectors available that include back-scattered electrons (for imaging), characteristic X-rays (for determining types and amounts of elements present in the sample), transmitted electrons, and cathodoluminescence. As this microscope requires considerable investment, look for superior technical support, extensive warranties and service contracts.
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- Description: The EVO MA series of scanning electron microscopes are an indispensable tool for every application area in materials analysis. From aggregates to zeolites, the research grade EVO SEM will provide an imaging solution
to drive your enterprise forward. Three different chamber types accept the widest range of specimen sizes whilst imaging to perfection. The EVO LS is the ideal SEM for the Life Science community, an arena that throws up difficult imaging challenges on a regular basis. The EVO LS is a true Environmental SEM with every model in the family allowing samples and specimens to be examined in their natural state under a range of conditions including very high water vapor pressure up to 3000 Pa. Wet samples can be imaged with ease, dehydration artifacts eliminated, and hydration and rehydration processes studied through water condensation with the optional Coolstage. With every specimen and all atmospheres, outstanding data-rich images are captured due to the optimized optical geometry, true secondary electron detection afforded by an unparalleled range of detectors and class-leading X-ray analysis.
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- Quantity: EA
- Description: Acquire images within seconds. Achieve atomic resolution. And measure and analyze surfaces entirely in 3D. Choose your system out of 3 different stands: from the entry level version MERLIN Compact with the proven GEMINI I electron column to the high end version with the high resolution GEMINI II column. The FE-SEM grows right alongside your challenges. With 15 ports for detectors and many analytical options, it brings you all the flexibility you will ever need. Use Atomic Force Microscopy and get information on semiconductor samples at atomic resolution. Or add the ultramicrotome 3View to achieve 3D reconstructions of large biological samples.
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- Quantity: EA
- Description: The SIGMA Series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you unparalleled resolution, contrast and brightness for imaging highly topographical samples. Featuring high vacuum and variable pressure modes of operation you profit from high definition imaging of conducting and non-conducting samples.
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